Identification of a threshold value for the DEMATEL method using the maximum mean de-entropy algorithm to find critical services provided by a semiconductor intellectual property mall

0957-4174/$ see front matter 2009 Elsevier Ltd. A doi:10.1016/j.eswa.2009.01.073 * Corresponding author. Tel.: +886 3 3706190. E-mail addresses: [email protected] (C.-W. L (G.-H. Tzeng). 1 Distinguished Chair Professor. To deal with complex problems, structuring them through graphical representations and analyzing causal influences can aid in illuminating complex issues, systems, or concepts. The DEMATEL method is a methodology which can confirm interdependence among variables and aid in the development of a chart to reflect interrelationships between variables, and can be used for researching and solving complicated and intertwined problem groups. The end product of the DEMATEL process is a visual representation— the impact-relations map—by which respondents organize their own actions in the world. In order to obtain a suitable impact-relations map, an appropriate threshold value is needed to obtain adequate information for further analysis and decision-making. In the existing literature, the threshold value has been determined through interviews with respondents or judged by the researcher. In most cases, it is hard and time-consuming to aggregate the respondents and make a consistent decision. In addition, in order to avoid subjective judgments, a theoretical method to select the threshold value is necessary. In this paper, we propose a method based on the entropy approach, the maximum mean de-entropy algorithm, to achieve this purpose. Using a real case to find the interrelationships between the services of a Semiconductor Intellectual Property Mall as an example, we will compare the results obtained from the respondents and from our method, and show that the impact-relations maps from these two methods could be the same. 2009 Elsevier Ltd. All rights reserved.